Semiconductor inspection probe tip material and tip shape... various selections available.
A semiconductor testing probe that can be customized with various selections for the probe tip material, surface treatment, tip shape, etc., to match the measurement target device!
Probes for semiconductor testing can be selected according to the measurement environment. - Probes made from our unique alloy material that enhance contact performance for lead-free applications. - Heat-resistant probes that utilize special springs to avoid load reduction due to thermal effects. - High-level non-magnetic material probes that can also be used for testing magnetic sensor components. - Short high-frequency probes that maximize signal transmission characteristics. We respond to various user requests. 【Features】 ■ Excellent quality backed by years of experience ■ A wide range of products ■ Various selections available for probe tip material, surface treatment, tip shape, etc., tailored to the measurement target device ■ Custom specifications are also available, allowing for arbitrary settings of total length, tip diameter, and spring pressure beyond standard specifications. *For details, please request materials or view the PDF data available for download.
- Company：精研 本社
- Price：Other
